ICT Test Probe 0.75mm
Test Probe

ICT

Electric current
>200mA
Resistance
≤30mΩ
Plating
Gold-plated 30U
Material
beryllium copper
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DXC-0023 ICT Spring Test Probe

Max OD:2mm, Total Length:33.4mm Current Capacity:＞200mA, Core Spring Force:50±5g Initial Core Resistance ≤30mΩ, Post-environment test ≤40mΩ Cycle Life:20,000 times, Material: Beryllium copper, 30U heavy gold plating

T0080
  • High-resilience beryllium copper maintains stable spring force after 20,000 frequent test cycles
  • 30U thick gold plating resists abrasion & oxidation, stable conduction under harsh temperature/humidity
  • Excellent resistance stability with tiny resistance rise after environmental aging for precise test readings
  • Moderate 50g force prevents scratch damage to PCB pads and copper traces
  • Extended length fits multi-layer test fixtures; thick pin body boasts strong anti-bending mechanical
ICT in-circuit test fixtures, PCB continuity inspection, semi-finished circuit function testing, home appliance & digital mainboard electrical verification. Custom tip style, spring force and length available.
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